#include "aes128_constraint.hpp"
#include "acir_format.hpp"
#include "barretenberg/circuit_checker/circuit_checker.hpp"
#include "barretenberg/common/assert.hpp"
#include "barretenberg/crypto/aes128/aes128.hpp"
#include "barretenberg/dsl/acir_format/test_class.hpp"
#include "barretenberg/dsl/acir_format/utils.hpp"
#include "barretenberg/numeric/random/engine.hpp"
#include <cstdint>
#include <gtest/gtest.h>
#include <vector>

Classes
class	AES128TestingFunctions< Builder_, IsPlaintextConstant, IsKeyConstant, IsIVConstant >
	Testing functions to generate the AES128Test test suite. More...

class	AES128TestingFunctions< Builder_, IsPlaintextConstant, IsKeyConstant, IsIVConstant >::InvalidWitness

class	AES128TestAllWitness< Builder >

class	AES128TestConstantPlaintext< Builder >

class	AES128TestConstantKey< Builder >

class	AES128TestConstantIV< Builder >

class	AES128TestAllConstant< Builder >

class	AES128RangeConstraintTest

class	AES128ShapeValidationTest

Typedefs
using	BuilderTypes = testing::Types< UltraCircuitBuilder, MegaCircuitBuilder >

Functions
	TYPED_TEST_SUITE (AES128TestAllWitness, BuilderTypes)

	TYPED_TEST (AES128TestAllWitness, GenerateVKFromConstraints)

	TYPED_TEST (AES128TestAllWitness, Tampering)

	TYPED_TEST_SUITE (AES128TestConstantPlaintext, BuilderTypes)

	TYPED_TEST (AES128TestConstantPlaintext, GenerateVKFromConstraints)

	TYPED_TEST (AES128TestConstantPlaintext, Tampering)

	TYPED_TEST_SUITE (AES128TestConstantKey, BuilderTypes)

	TYPED_TEST (AES128TestConstantKey, GenerateVKFromConstraints)

	TYPED_TEST (AES128TestConstantKey, Tampering)

	TYPED_TEST_SUITE (AES128TestConstantIV, BuilderTypes)

	TYPED_TEST (AES128TestConstantIV, GenerateVKFromConstraints)

	TYPED_TEST (AES128TestConstantIV, Tampering)

	TYPED_TEST_SUITE (AES128TestAllConstant, BuilderTypes)

	TYPED_TEST (AES128TestAllConstant, GenerateVKFromConstraints)

	TYPED_TEST (AES128TestAllConstant, Tampering)

	TEST_F (AES128RangeConstraintTest, PlaintextOutOfRangeFails)
	Test that plaintext byte values > 255 cause circuit failure at the RANGE CONSTRAINT, not at the lookup tables.

	TEST_F (AES128RangeConstraintTest, KeyOutOfRangeFails)
	Test that key byte values > 255 cause circuit failure at the RANGE CONSTRAINT.

	TEST_F (AES128RangeConstraintTest, IVOutOfRangeFails)
	Test that IV byte values > 255 cause circuit failure at the RANGE CONSTRAINT.

	TEST_F (AES128RangeConstraintTest, OutputOutOfRangeFails)
	Test that output byte values > 255 cause circuit failure at the RANGE CONSTRAINT.

	TEST_F (AES128ShapeValidationTest, InputsNotBlockAlignedRejected)

	TEST_F (AES128ShapeValidationTest, OutputsSizeMismatchRejected)

Typedef Documentation

◆ BuilderTypes

using BuilderTypes = testing::Types<UltraCircuitBuilder, MegaCircuitBuilder>

Definition at line 245 of file aes128_constraint.test.cpp.

Function Documentation

◆ TEST_F() [1/6]

TEST_F	(	AES128RangeConstraintTest	,
		IVOutOfRangeFails
	)

Test that IV byte values > 255 cause circuit failure at the RANGE CONSTRAINT.

Same logic with correct byte ordering: 256 in LSB position overflows to adjacent byte.

Definition at line 589 of file aes128_constraint.test.cpp.

◆ TEST_F() [2/6]

TEST_F	(	AES128RangeConstraintTest	,
		KeyOutOfRangeFails
	)

Test that key byte values > 255 cause circuit failure at the RANGE CONSTRAINT.

Same logic as PlaintextOutOfRangeFails with correct byte ordering:

256 in LSB position (index 15) overflows to 1 in position 14

Definition at line 544 of file aes128_constraint.test.cpp.

◆ TEST_F() [3/6]

TEST_F	(	AES128RangeConstraintTest	,
		OutputOutOfRangeFails
	)

Test that output byte values > 255 cause circuit failure at the RANGE CONSTRAINT.

For outputs, we provide witnesses that pack to the same value using LSB overflow: If valid output is [..., X, Y], then [..., X-1, Y+256] packs to the same value: (X-1)*256^1 + (Y+256)*256^0 = X*256 - 256 + Y + 256 = X*256 + Y

Definition at line 636 of file aes128_constraint.test.cpp.

◆ TEST_F() [4/6]

TEST_F	(	AES128RangeConstraintTest	,
		PlaintextOutOfRangeFails
	)

Test that plaintext byte values > 255 cause circuit failure at the RANGE CONSTRAINT, not at the lookup tables.

This tests the "overflow attack" scenario with correct byte ordering:

Packing is big-endian: byte[0] is MSB (×256^15), byte[15] is LSB (×256^0)
Attacker provides plaintext [..., 0, 256] (256 in LSB position 15)
packed = 256 * 256^0 = 256
When sliced: 256 % 256 = 0, 256 / 256 = 1 → slices = [0, 1, 0, ...]
This corresponds to valid plaintext [..., 1, 0] (1 in position 14)

The range constraint should catch this attack.

Definition at line 489 of file aes128_constraint.test.cpp.

◆ TEST_F() [5/6]

TEST_F	(	AES128ShapeValidationTest	,
		InputsNotBlockAlignedRejected
	)

Definition at line 716 of file aes128_constraint.test.cpp.

◆ TEST_F() [6/6]

TEST_F	(	AES128ShapeValidationTest	,
		OutputsSizeMismatchRejected
	)

Definition at line 722 of file aes128_constraint.test.cpp.

◆ TYPED_TEST() [1/10]

TYPED_TEST	(	AES128TestAllConstant	,
		GenerateVKFromConstraints
	)

Definition at line 350 of file aes128_constraint.test.cpp.

◆ TYPED_TEST() [2/10]

TYPED_TEST	(	AES128TestAllConstant	,
		Tampering
	)

Definition at line 356 of file aes128_constraint.test.cpp.

◆ TYPED_TEST() [3/10]

TYPED_TEST	(	AES128TestAllWitness	,
		GenerateVKFromConstraints
	)

Definition at line 259 of file aes128_constraint.test.cpp.

◆ TYPED_TEST() [4/10]

TYPED_TEST	(	AES128TestAllWitness	,
		Tampering
	)

Definition at line 265 of file aes128_constraint.test.cpp.

◆ TYPED_TEST() [5/10]

TYPED_TEST	(	AES128TestConstantIV	,
		GenerateVKFromConstraints
	)

Definition at line 327 of file aes128_constraint.test.cpp.

◆ TYPED_TEST() [6/10]

TYPED_TEST	(	AES128TestConstantIV	,
		Tampering
	)

Definition at line 333 of file aes128_constraint.test.cpp.

◆ TYPED_TEST() [7/10]

TYPED_TEST	(	AES128TestConstantKey	,
		GenerateVKFromConstraints
	)

Definition at line 304 of file aes128_constraint.test.cpp.

◆ TYPED_TEST() [8/10]

TYPED_TEST	(	AES128TestConstantKey	,
		Tampering
	)

Definition at line 310 of file aes128_constraint.test.cpp.

◆ TYPED_TEST() [9/10]

TYPED_TEST	(	AES128TestConstantPlaintext	,
		GenerateVKFromConstraints
	)

Definition at line 281 of file aes128_constraint.test.cpp.

◆ TYPED_TEST() [10/10]

TYPED_TEST	(	AES128TestConstantPlaintext	,
		Tampering
	)

Definition at line 287 of file aes128_constraint.test.cpp.

◆ TYPED_TEST_SUITE() [1/5]

TYPED_TEST_SUITE	(	AES128TestAllConstant	,
		BuilderTypes
	)

◆ TYPED_TEST_SUITE() [2/5]

TYPED_TEST_SUITE	(	AES128TestAllWitness	,
		BuilderTypes
	)

◆ TYPED_TEST_SUITE() [3/5]

TYPED_TEST_SUITE	(	AES128TestConstantIV	,
		BuilderTypes
	)

◆ TYPED_TEST_SUITE() [4/5]

TYPED_TEST_SUITE	(	AES128TestConstantKey	,
		BuilderTypes
	)

◆ TYPED_TEST_SUITE() [5/5]

TYPED_TEST_SUITE	(	AES128TestConstantPlaintext	,
		BuilderTypes
	)

Classes

Typedefs

Functions